منابع مشابه
Test-cubes Compaction for Digital Circuits
The generation of minimal sets for faults detection in digital circuits, is an important problem in the industry. Unfortunately, the problem has been demonstrated to be NP-hard. In this report we present six heuristics capable to reduce a given sets of test-cubes to a minimal set of test-cases, with an average compression of about the 95%. The methods that we propose, combine together personal ...
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A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses the concept of sensitizing cubes introduced in an earlier paper and a new, more efficient algorithm for generating them. Sensitizing cubes of the next state and output logic are used to obtain static sensitizing vectors...
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ژورنال
عنوان ژورنال: IPSJ Transactions on System LSI Design Methodology
سال: 2010
ISSN: 1882-6687
DOI: 10.2197/ipsjtsldm.3.283